Jordan Valley Named Among Deloitte’s Fast 50 Israel Technology Companies for 2012

Jordan Valley Semiconductors Ltd. was named today one of Deloitte’s Fast 50 Israeli Technology companies for 2012, a program that recognizes and profiles fast growing technology companies. The program ranks the 50 fastest growing technology companies in Israel, public or private, and includes all technology sectors: Communications; Software; Semiconductors; Components and Electronics; Life Sciences; Internet; and Computer Peripherals.

To determine the fastest growing companies, Deloitte reviewed fiscal year revenues over five years (2007-2011), then calculated and compared the percentage revenue growth of technology companies over this time.

« The significance of our ranking among the Fast 50, for the 5th time, goes beyond the recognition of our growth rate and reflects on our successful strategy to widen our products by development of advanced, exciting products for the semiconductors industries » commented Isaac Mazor, Jordan Valley’s founder and CEO. « It is worth noting that our 5-year cumulative growth rate, which earned Jordan Valley 26th place, represents a compounded aggregate annual growth rate of 28%. This is a strong indication of Jordan Valley’s sustainable business model in a highly cyclic market. » Added Mr. Mazor

« Achieving sustained revenue growth of 169% over five years is a tremendous accomplishment for a technology company operating in a competitive world », said Tal Chen, partner in charge of the Deloitte Brightman Almagor Zohar Israel Technology Fast 50 Program. Jordan Valley deserves a lot of credit for its remarkable growth, and we commend them for it. »

About Jordan Valley Semiconductors, Ltd

JVS provides suite of non-destructive x-ray metrology tools for in-line semiconductors process monitoring such as HiK and metal gate materials, interconnect and microbumps for advanced electronic devices such as smart phones. JVS products are used for advanced processes (3Xnm and 2Xnm production), R&D (GaN and III/V/Si for 14nm/10nm technology nodes) and crystalline defects (NVD) detection for up to 450mm wafers.

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